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Journal Articles

Transient response of charge collection by single ion strike in 4H-SiC MESFETs

Onoda, Shinobu; Iwamoto, Naoya; Ono, Shuichi*; Katakami, Shuji*; Arai, Manabu*; Kawano, Katsuyasu*; Oshima, Takeshi

IEEE Transactions on Nuclear Science, 56(6), p.3218 - 3222, 2009/12

https://doi.org/10.1109/TNS.2009.2032395
 Times Cited Count：18 Percentile：74.57(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

Soft-error rate in a logic LSI estimated from SET pulse-width measurements

Makino, Takahiro; Kobayashi, Daisuke*; Hirose, Kazuyuki*; Takahashi, Daisuke*; Ishii, Shigeru*; Kusano, Masaki*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi

IEEE Transactions on Nuclear Science, 56(6), p.3180 - 3184, 2009/12

https://doi.org/10.1109/TNS.2009.2033795
 Times Cited Count：13 Percentile：64.65(Engineering, Electrical & Electronic)

SET-induced soft-error rates ($$SER_{SET}$$s) of logic LSIs are estimated from SET pulse-widths measured in logic cells used in logic LSIs. The estimated rates are consistent with directly measured $$SER_{SET}$$s for logic LSIs.

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